Update

Last modified by Administrator on 2019/04/01 10:36
2018AY Graduation Day of the lab.

2018graduation.JPG

発表予定

  • IEEE International Conference on Consumer Electronics
    日程: 2020年1月4日(土)~6日(月)
    場所: ラスベガス,アメリカ合衆国
    タイトル:  Temperature Monitoring in Shinkansen Signal and Communication House
    著者:  上原優衣,大竹哲史(大分大)
  • IEEE Asian Test Symposium
    日程: 2019年12月10日(火)~13日(金)
    場所: コルカタ,インド
    タイトル:  A Built-in Self-diagnostic Mechanism for Delay Faults Based on Self-generation of Expected Signatures
    著者: 平本悠翔郎,大竹哲史(大分大),高橋 寛(愛媛大学)

最近の発表

  • 37th International Conference on Consumer Electronics
    日程: 2019年1月11日(金)~13日(日)
    場所: ラスベガス,アメリカ合衆国
    タイトル: Factory Environment Monitoring: A Japanese Tea Manufacturer's Case
    著者: 上原優衣,大竹哲史(大分大)

To be presented

  • IEEE Asian Test Symposium
    Date: December 10-13, 2019
    Place: Kolkata, India
    Title: A Built-in Self-diagnostic Mechanism for Delay Faults Based on Self-generation of Expected Signatures
    Authors: Yushiro Hiramoto, Satoshi Ohtake (Oita Univ.) and Hiroshi Takahashi (Ehime Univ.)

Recent publications

  • IEICE Technical Committee on Dependable Computing
    Date: February 27, 2019
    Place: Kikai-shinko Kaikan, Tokyo
    Title: A built-in self-diagnosis mechanism based on self-generation of expected signatures
    Authors: Yushiro Hiramoto, Satoshi Ohtake (Oita Univ.), Hiroshi Takahashi (Ehime Univ.)
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Created by Administrator on 2011/09/06 16:42

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